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@prefix sub: <https://w3id.org/np/RAdvr20I9pbtWzIsCTNKx5YqR17qDAqbJLh4FCaEjKcdg/> .
@prefix np: <http://www.nanopub.org/nschema#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix nt: <https://w3id.org/np/o/ntemplate/> .
@prefix npx: <http://purl.org/nanopub/x/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix orcid: <https://orcid.org/> .
@prefix ns1: <http://purl.org/np/> .
@prefix prov: <http://www.w3.org/ns/prov#> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .

sub:Head {
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    np:hasProvenance sub:provenance;
    np:hasPublicationInfo sub:pubinfo .
}

sub:assertion {
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    dct:description "the energy difference between the top of the valence band and the bottom of the conduction band in a semiconductor or insulator.";
    rdfs:label "Energy band gap", "energy band gap of material";
    rdfs:seeAlso <http://semanticscience.org/resource/CHEMINF_000487>;
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}

sub:provenance {
  sub:assertion prov:wasAttributedTo orcid:0009-0002-2913-1293 .
}

sub:pubinfo {
  orcid:0009-0002-2913-1293 foaf:name "Christos Vasileiou" .
  
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    dct:license <https://creativecommons.org/licenses/by/4.0/>;
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